25

[IEEE 2016 Joint IEEE International Symposium on the Applications of Ferroelectrics, European Conference on Application of Polar Dielectrics, and Piezoelectric Force Microscopy Workshop (ISAF/ECAPD/PFM) - Darmstadt (2016.8.21-2016.8.25)] 2016 Joint IEEE International Symposium on the Applications of Ferroelectrics, European Conference on Application of Polar Dielectrics, and Piezoelectric Force Microscopy Workshop (ISAF/ECAPD/PFM) - Evaluatioion of deuterium ion profile in (Pb,La)(Zr,Ti)O 3 capacitors structures with conductive oxide top electrode by time of flight secondary ion mass spectrometry

Takada, Yoko, Tamano, Rika, Okamoto, Naoki, Saito, Takeyasu, Yoshimura, Takeshi, Fujimura, Norifumi, Higuchi, Koji, Kitajima, Akira, Shishido, Rie
Year:
2016
Language:
english
File:
PDF, 3.36 MB
english, 2016
38

Anomalous Resolutions in Scanning Thermal Microscopy of Graphite

Sano, Masahito, Yudasaka, Masako, Kikuchi, Rie, Yoshimura, Susumu
Journal:
Langmuir
Year:
1997
Language:
english
File:
PDF, 205 KB
english, 1997